|
|
| Автор: Bob Sheil |
| Издательство: John Wiley & Sons Limited |
| Cтраниц: 1 |
| Формат: PDF |
| Размер: 0 |
| ISBN: 9781118860977 |
| Качество: excellent |
| Язык: |
|
 |
|
Описание:
|
A pioneering title, High Definition explores the onslaught of new and highly accurate digital metrology tools in large- and small-scale 3-D scanning and 3-D modelling. Capable of measuring space to an accuracy of less than 1 mm, these tools offer unprecedented precision for the development and interrogation of design before, during and post production. Over the last decade or so, the array of designers’ digital tools to propose and make their ideas have evolved significantly, but the absence of high-accuracy, zero-tolerance design production has often remained the missing piece between design and fulfilment. Innovative technologies are thus substantially recalibrating the way that designers operate in the world between the drawn and the made, having the power to transform the architect’s role from that of visualiser to one that is intensely involved with the realisation of objects and buildings. High Definition will examine the capabilities of advanced technologies in design production through their impact on design theory, practice and greater levels of collaboration between design and manufacturing. It will permeate the entangled world between means and meaning and unravel a new understanding between the representation and production of architectural design. Contributors include: Philip Beesley, Centre for Advanced Spatial Analysis, Gehry Technologies, Ruairi Glynn, Zaha Hadid Architects, ScanLAB Projects, Territorial Agency, Skylar Tibbits, Mike Webb.
|
Пресс - релиз
string(4) "true"
int(166)
|
