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| Автор: Xinwei Wang |
| Издательство: John Wiley & Sons Limited |
| Cтраниц: 1 |
| Формат: PDF |
| Размер: 0 |
| ISBN: 9781118310199 |
| Качество: excellent |
| Язык: |
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Описание:
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This book covers the new technologies on micro/nanoscale thermal characterization developed in the Micro/Nanoscale Thermal Science Laboratory led by Dr. Xinwei Wang. Five new non-contact and non-destructive technologies are introduced: optical heating and electrical sensing technique, transient electro-thermal technique, transient photo-electro-thermal technique, pulsed laser-assisted thermal relaxation technique, and steady-state electro-Raman-thermal technique. These techniques feature significantly improved ease of implementation, super signal-to-noise ratio, and have the capacity of measuring the thermal conductivity/diffusivity of various one-dimensional structures from dielectric, semiconductive, to metallic materials.
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